Diagnostic measurements in LSI/VLSI integrated circuits production / Andrzej Jakubowski, Wiesław Marciniak, Henryk M. Przewłocki.

By: Jakubowski, Andrzej
Contributor(s): Marciniak, Wiesław | Przewłocki, Henryk M
Material type: TextTextSeries: Advanced series in electrical and computer engineering ; vol. 7Publisher: Singapore ; Teaneck, NJ : World Scientific, c1991Description: xv, 356 p. : ill. ; 23 cmISBN: 9810202822Subject(s): Integrated circuits -- Very large scale integration -- Design and construction | Integrated circuits -- Very large scale integration -- TestingDDC classification: 621.39/5 LOC classification: TK7874 | .J34 1991
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Item type Current location Call number Status Date due Barcode
Books Books Centeral Library
Second Floor - Engineering & Architecture
621.395 J.A.D 1991 (Browse shelf) Available 637

Includes bibliographical references.

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