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Modern RF and microwave measurement techniques / edited by Valeria Teppati, ETH Zurich, Andrea Ferrero, Politecnico di Torino, Mohamed Sayed, Microwave and Millimeter Wave Solutions.

By: Teppati, Valeria, 1974-
Material type: TextTextSeries: The cambridge RF and microwave engineering seriesPublisher: New York : Cambridge University Press, 2013Edition: 1st edDescription: xxv, 447 pages : illustrations ; 26 cmContent type: text Media type: unmediated Carrier type: volumeISBN: 9781107036413 (hardback)Subject(s): Radio measurements | Microwave measurements | Radio circuits | TECHNOLOGY & ENGINEERING / MicrowavesDDC classification: 621.3820287 LOC classification: TK6552.5 | .M63 2013Other classification: TEC024000 Online resources: Cover image Summary: "This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analysers, real-time spectrum analysis, sampling oscilloscopes and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and dielectric measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail, and accompanied by state-of-the-art solutions to the unique technical challenges associated with its deployment. With each chapter delivered by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements"--
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621.3820287 T.V.M 2013 (Browse shelf) Available 21717

Includes bibliographical references and index.

"This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analysers, real-time spectrum analysis, sampling oscilloscopes and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and dielectric measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail, and accompanied by state-of-the-art solutions to the unique technical challenges associated with its deployment. With each chapter delivered by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements"--

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