TY  - BOOK
AU  - Root,David E.
AU  - Verspecht,Jan
AU  - Horn,Jason
AU  - Marcu,Mihai
TI  - X-parameters: characterization, modeling, and design of nonlinear RF and microwave components 
T2  - The Cambridge RF and microwave engineering series
SN  - 9780521193238 (hardback)
AV  - TK7876 .R66 2013
U1  - 621.38412 23
PY  - 2013///
CY  - Cambridge, United Kingdom
PB  - Cambridge University Press
KW  - Microwave circuits
KW  - Design and construction
KW  - Mathematics
KW  - Electric circuits, Nonlinear
KW  - Parametric devices
KW  - Differential equations
KW  - TECHNOLOGY & ENGINEERING / Microwaves
KW  - bisacsh
N1  - Includes bibliographical references; Machine generated contents note: 1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory
N2  - "This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering"--
ER  -