TY  - BOOK
AU  - Brainina,Irina S.
TI  - Applications of random process excursion analysis
T2  - Elsevier insights
SN  - 9780124095014
AV  - TK5102.9 .B713 2013
U1  - 620.0011 23
PY  - 2013///]
CY  - Amsterdam, Boston, Heidelberg, London, New York, Oxford, Paris, San Diego, San Francisco, Singapore, Sydney, Tokyo
PB  - Elsevier
KW  - Signal processing
KW  - Mathematics
KW  - fast
N1  - Includes bibliographical references (pages 227-233) and index
N2  - This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics. Introduces English-speaking students and researchers in to the results obtained in the former Soviet/ Russian academic institutions within last few decades. Supplies a range of applications suitable for all levels from undergraduate to professional. Contains computer simulations. --
UR  - http://www.loc.gov/catdir/enhancements/fy1606/2013941676-d.html
ER  -