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X-parameters : characterization, modeling, and design of nonlinear RF and microwave components / David E. Root, Agilent Technologies Inc., Jan Verspecht, Agilent Technologies Inc., Jason Horn, Agilent Technologies Inc., Mihai Marcu, Agilent Technologies Inc.

By: Contributor(s): Material type: TextTextSeries: The Cambridge RF and microwave engineering seriesPublisher: Cambridge, United Kingdom : Cambridge University Press, 2013Edition: 1st edDescription: xi, 219 pages : illustrations ; 26 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9780521193238 (hardback)
  • 0521193230 (hardback)
Subject(s): DDC classification:
  • 621.38412 23
LOC classification:
  • TK7876 .R66 2013
Other classification:
  • TEC024000
Contents:
Machine generated contents note: 1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.
Summary: "This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering"--
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Holdings
Item type Current library Call number Status Date due Barcode
Books Books Centeral Library Second Floor - Engineering & Architecture 621.38412 R.D.X 2013 (Browse shelf(Opens below)) Available 21753
Books Books Centeral Library Second Floor - Engineering & Architecture 621.38412 R.D.X 2013 (Browse shelf(Opens below)) Available 21754

Includes bibliographical references.

Machine generated contents note: 1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.

"This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering"--

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