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Diagnostic measurements in LSI/VLSI integrated circuits production / Andrzej Jakubowski, Wiesław Marciniak, Henryk M. Przewłocki.

By: Contributor(s): Material type: TextTextSeries: Advanced series in electrical and computer engineering ; vol. 7Publication details: Singapore ; Teaneck, NJ : World Scientific, c1991.Description: xv, 356 p. : ill. ; 23 cmISBN:
  • 9810202822
Subject(s): DDC classification:
  • 621.39/5 20
LOC classification:
  • TK7874 .J34 1991
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Holdings
Item type Current library Call number Status Date due Barcode
Books Books Centeral Library Second Floor - Engineering & Architecture 621.395 J.A.D 1991 (Browse shelf(Opens below)) Available 637

Includes bibliographical references.

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