000 01175cam a2200337 a 4500
999 _c5630
_d5630
001 15531846
005 20180623123601.0
008 081121s2009 nyua 001 0 eng
010 _a 2008049641
020 _a007162130X (alk. paper)
020 _a9780071621304 (alk. paper)
035 _a(OCoLC)ocn276930371
040 _aDLC
_cDLC
_dC#P
_dBWX
_dIXA
_dCDX
_dYDXCP
_dDLC
050 0 0 _aQA276.4
_b.B378 2009
082 0 0 _a658.562
_222
100 1 _aBass, Issa.
245 1 0 _aLean six sigma using SigmaXL and Minitab /
_cIssa Bass, Barbara Lawton.
250 _a1st ed.
260 _aNew York :
_bMcGraw-Hill,
_cc2009.
300 _axv, 362 p. :
_bill. ;
_c24 cm.
505 0 _aDefine -- Measure -- Analyze -- Improve -- Control.
630 0 0 _aMinitab.
650 0 _aCritical path analysis.
650 0 _aSix sigma (Quality control standard)
650 0 _aStatistics
_vSoftware.
700 1 _aLawton, Barbara,
_cPh. D.
906 _a7
_bcbc
_corignew
_d1
_eecip
_f20
_gy-gencatlg
942 _2ddc
_cBK